AFM探针描述
适用的Sample:
Other Hard Samples,Other Soft Sample
适用的AFM机型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
适用的Work Mode:
contact,Force spectroscopy
适用的Application:
Coating 描述
| tip coating | -- |
|---|
Tip 规格
| tip geometry | Tipless |
|---|---|
| tip radius (Nom) | -- |
| tip height | -- |
Cantilever 规格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 10.4N/m,1.3N/m,0.16N/m |
| Frequency(Nom) | 293KHz,71KHz,18KHz |
| length(Nom) | 97um,197um,397um |
| thickness(Nom) | 2um |
| cantilever material | 1 Ωcm Silicon |
| top layer back | -- |
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Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
