AFM探针描述
适用的Sample:
Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
适用的AFM机型:
DimensionFastScan,DimensionIcon,DimensionXR,Innova,Insight,JPK,MultiMode,Non-Bruker
适用的Work Mode:
contact
适用的Application:
General Topography
Coating 描述
| tip coating | -- |
|---|
Tip 规格
| tip geometry | Rotated (Symmetric) |
|---|---|
| tip radius (Nom) | 8nm |
| tip height | 10-15um |
| Front Angle (FA) | 15±2° |
| Back Angle (BA) | 25±2° |
| Side Angle (SA) | 17.5±2° |
Cantilever 规格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 0.9N/m |
| Frequency(Nom) | 20KHz |
| length(Nom) | 450um |
| thickness(Nom) | 3.25um |
| cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
| top layer back | -- |
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Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
