AFM探针描述
适用的Sample:
Bio Molecules,Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
适用的AFM机型:
DimensionIcon,DimensionXR
适用的Work Mode:
PeakForce QNM,PeakForce QNM High-Accuracy,peakforce tapping,ScanAsyst
适用的Application:
General Topography,Mechanical Property Mapping
Coating 描述
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
Tip 规格
| tip geometry | Rotated |
|---|---|
| tip radius (Nom) | 30nm |
| tip height | 3-8um |
| Front Angle (FA) | 15° |
| Back Angle (BA) | 25° |
Cantilever 规格
| cantilever geometry | Special |
|---|---|
| K(Nom) | 0.25N/m |
| Frequency(Nom) | 55KHz |
| length(Nom) | 110um |
| thickness(Nom) | 0.58um |
| cantilever material | Silicon Nitride |
| top layer back | -- |
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Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
